Abstract

A system-level total ionizing dose test method of satellite subsystems is discussed in the context of the radiation qualification of a satellite. System-level tests are performed with high-energy X-rays, and the irradiation results of the key subsystems, including the on-board computer, attitude- and orbit-control-system computer, and battery management system, are presented and analyzed in terms of the repeatability of the results, the observability issues, and the importance of the test conditions. Furthermore, the main benefits of the system-level total ionizing dose tests of the given subsystems are discussed, as well as the risks related to performing tests at the system level.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call