Abstract
Previous theory indicated that the individual monolayers within transition metal ferromagnet thin-films contribute different magnitudes to the total ferromagnetic damping. Here, the aim was to investigate if the thin-film damping could be reduced by electronic engineering of the higher damping regions via localized doping. We present new theoretical analysis and experimental results for sputtered Co thin-films in which the upper and lower surface regions were locally doped with Cr. Theory indicates that local doping does reduce the damping and the experiments show a comparable reduction of the damping with increasing local doping up to 30% Cr, while the measured damping falls further with higher local doping, which may be attributed to changes in the film structure. This work opens a route to create low-damping magnetic thin-films.
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