Abstract
The paper considers a diffraction model of a new type of focusing elements for x-ray optics based on profiled multilayer reflection structures. The characteristics of the focusing properties of synthesized Fresnel structures (SFS) were compared to those of conventional ‘‘transparent’’ zone plates. The latter were shown to exhibit fundamental resolution limits caused by the effects of volume diffraction in structures of real thickness. SFS x-ray optical elements are free from such limitations and display the properties of volume holographic lattices, namely, absence of chromatic aberrations, high efficiency and spatial resolution. The first experimental results of the investigation of SFS focusing properties in the soft x-ray wavelength range are reported. It is most advantageous to use SFS elements for controlling powerful synchrotron radiation beams, since they combine the temperature stability of multilayer mirrors with the possibility to obtain resolution below 0.1 μm.
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