Abstract
We synthesized, using physical vapour deposition under vacuum, series of CoxFe100–x alloy thin films onto Si (111) substrate, x ranging from 38 to 65 at.%. The X-ray patterns present almost (110) and (211) textures with a grain size varying with the composition. The atomic force microscopy images show flat surfaces. The lattice constant value decreases rapidly with x. The root mean square roughness increases with x. The easy magnetic axis has been found to lie in the plane of the film. The magnetization curves present rectangular hysteresis loops inferring no in-plane anisotropy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
