Abstract
Epitaxial film electrodes of La0.8Sr0.2MnO2 (LSM) and Y0.5Ca0.5MnO3 (YCM) with the perovskite structure were obtained by annealing films deposited on the yttria- stabilized zirconia (YSZ) substrates by pulsed laser deposition method. These films were characterized by thin-film X-ray diffraction measurement and ac impedance spectroscopy. The film orientations depended on the substrate plane of YSZ. The electrode reactions proceeded by successive several processes. The activation energies of charge transfer process of both the LSM and YCM films depended on the crystal plane of the electrode surface; the film on YSZ (100) showed smaller activation energy than the film on YSZ (110). Charge transfer process of the LSM films was also affected by the lattice misfit. The crystal plane of the electrode surface and structural distortion of the film were indicated to be important parameters for the electrode reaction.
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