Abstract

An electrochemical process was used to deposit zinc sulfide thin films on glass substrates. The study aims to determine whether the annealing of zinc sulfide thin films changes their properties. An analysis of the X-ray diffraction patterns (XRD) determined that annealing controls zinc sulfide (ZnS) thin-film crystallinity and influences the structure of zinc sulfide crystallites, which range from cubic to hexagonal. A Field Emission Scanning Electron Microscope was used (FESEM) to obtain images of thin films. None of thin films that not paneled or annealed displayed grain-like morphologies. while grain growth was an appropriate response to annealing at 150, 250 or 350 °C. Distributed crystalline quality, the EDX analysis confirms the presence of zinc and sulfur in the obtained films, distributed crystalline quality.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.