Abstract
A new compound DySr 5Ni 2.4Cu 0.6O 12− δ has been prepared by sol gel method and annealed at 1473 K in 1 atm of Ar gas flow. The X-ray diffraction (XRD) is used for phase identification. The sample shows to adopt the K 2NiF 4-type structure based on tolerance factor calculation. XRD analysis using the Rietveld method was carried out and it was found that DySr 5Ni 2.4Cu 0.6O 12− δ (Dy 0.33Sr 1.67Ni 0.8Cu 0.2O 4− δ′ ) compound crystallizes in tetragonal symmetry with space group I4/ mmm ( Z=2). The lattice parameters are found to be at room temperature a=3.7696(5) Å and c=12.3747(2) Å. The final reliability indices were: R B =5.219% and χ 2=3.47. Four probe electrical resistivity measurements were performed versus temperature in the range 294–579 K. A semiconducting behaviour over the whole range of temperature, with a conductivity maximum of 0.4 S cm −1 is observed at 510 K.
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