Abstract
Nanoparticle V2O5 is prepared by the measurement of X-ray diffraction (XRD) and atomic force microscopy (AFM) analyses. The crystallite size = 19.59 nm, optical energy gap = 2.6 eV, an average particle size of 29.58 nm and, RMS roughness of ~6.8 nm. Also, Fourier transformer infrared spectrophotometer (FTIR) showed a porous free morphology with homogeneity and uniformity on the sample surface. The film surface exhibited no apparent cracking and, the grains exhibited large nicely separated conical columnar growth combined grains throughout the surface with coalescence of some columnar grains at a few places. The fabrication of a thin film of V2O5 NPs/PSi heterojunction photodetector was characterized and investigated.
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