Abstract
Sum patterns find applications in Radar for searching and ranging of the targets. A sum pattern with low sidelobe level is a desirable feature in these applications, in order to reduce EMI problems. Sum patterns with Asymmetrical sidelobe topography are considered, in applications where only certain angular regions of pattern are required to have low sidelobe level. Asymmetrical pattern characteristics can have lower beam widths for given design specifications as compared to symmetrical patterns. In view of this, a conventional method of synthesis is carried out in this paper, to produce asymmetrical sidelobe level patterns using discrete arrays. The effect of beam scanning on the pattern behavior is also analyzed for the above synthesized patterns.
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