Abstract
Large-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
