Abstract
Abstract High quality CeB 6 thin films have been obtained through direct evaporation of raw micron-sized CeB 6 powders at a pressure of 70 Pa. The X-ray diffraction (XRD), Raman spectrum, scanning electron microscope (SEM), transmission electron microscopy (TEM), selected-area electron diffraction (SAED) and the field-emission equipment were used to characterize the morphology, structure, composition and FE properties of the samples. The XRD and Raman spectrum analysis results show the as-prepared product is cubic phase CeB 6 . The TEM, SAED and HRTEM analysis reveal that the samples are mixtures of thin films (polycrystalline) and small crystals (single crystallines aligned preferentially in the [1 1 0] direction). Compared to oxide nanostructures, field-emission measurements show that the CeB 6 films have better FE performance with turn-on field and threshold field of 12.93 V/μm and 14.86 V/μm, respectively.
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