Abstract
SummaryNanocrystalline Bismuth Telluride (Bi2Te3) thin film was electrodeposited potentiostatically at room temperature from acidic bath. In order to study their structural, morphological properties and compositional analysis of as synthesized thin film were systematically examined by X‐ray diffraction (XRD), scanning electron microscopy (SEM) and and energy dispersive spectroscopy (EDS). The crystallographic characterization of Bi2Te3 thin film was carried out using XRD and main diffraction peak at (015) plane of the Bi2Te3 confirmed that the formation of rhombohedral crystal structure. Rapid development in thermoelectric material due to directly converting thermal energy to electric energy. The thermoelectric performance of Bi2Te3 thin film was assessed with the result of electrical resistivity and Seebeck coefficient parameters. In addition, such well adherent Bi2Te3 thin film with improved Seebeck coefficient and electrical conductivity which is helpful for development of efficient materials for thermoelectric application. In order to study the thermoelectric performance of Bi2Te3 it is prepared by potentiostatic electrodeposition.
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