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Abstract
In this work, aluminum telluride thin films were synthesized via using a systematically electrodeposited method at different applied anodic potentials (2–12 V) on conductive FTO glass substrates. As the aluminium sheet was used as a source of Al3+ cation and the Na2TeO3 solution produced Te2- anion. X-ray diffractometry (XRD), field-emission scanning electron microscopy (FESEM), energy dispersive spectroscopy (EDS), and ultraviolet–visible (UV) spectroscopy were employed to investigate the unique properties of the Al2Te3 thin films. The results reveal that the electrodeposited Al2Te3 films can be a good promising candidate for a solar absorber material or other optoelectronic applications through the analysis of structural, morphological, and optical properties with the significant evidence of the optimum applied anodic potential condition in the range of 8–12 V.
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