Abstract
The Ln(Ti 0.8Sn 0.2)TaO 6 (Ln = Nd, Sm) ceramics are prepared through the solid-state ceramic route. The structure of the materials is studied using X-ray diffraction and Raman spectral analysis. The microstructure is analyzed using scanning electron microscopy and the elemental composition by energy dispersive spectrometry. The dielectric properties in the radio as well as in the microwave frequencies are studied. The photoluminescence property of the samples is also analyzed. The materials have dielectric constants 32.3 and 31.1, temperature coefficient of resonant frequency +1.5 ppm/K and −6 ppm/K and high quality factor and hence suitable for the fabrication of devices in microwave communication. Moreover, the compounds are useful in the field of optoelectronics since they produce intense emission lines in the visible region.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
