Synthesis and X-ray diffraction study of CuCr1-xVxS2

Abstract

New cation-conducting materials CuCr1-xVxS2 (x = 0, 0.05, 0.1, 0.15, 0.2, 0.25, 0.3) were synthesized. The materials withx = 0, 0.05, 0.1, and 0.15 were found to be single-phase. The x-ray patterns of the materials withx = 0.2, 0.25, and 0.3 indicated the presence of trace levels of Cu3VS4. Refinement of the positional parameters of Cu atoms shows that the relative Cu occupancies on three nonequivalent sites depend on temperature and vanadium content.