Abstract
ZrO2-Al2O3 and ZrO2-Y2O3 coatings were synthesized using sol-gel technology with a complexing agent and HNO3 acid catalyst. The resulting coatings were deposited on Nb/Al, Ti/Al substrates. The synthesized coatings were studied by X-ray photoelectron spectroscopy (XPS analysis), Atomic Force Microscopy (AFM) and XRD (X-ray phase analysis). The obtained data indicate that XPS analysis is very suitable for studying the deposited coatings. Interesting data on the phase composition and surface morphology were obtained from the XRD analysis and the AFM method.
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