Abstract
We report on the synthesis, structural and electrical characterization of high quality Tl2Ba2Ca1Cu2O8 (Tl-2212) superconducting films. The samples have been grown ex-situ on mm2 LaAlO3 (100) substrates by a combined approach of metal-organic chemical vapor deposition (MOCVD) and thallium vapor diffusion. The morphological and compositional nature of the c-axis oriented films has been investigated by SEM and X-ray analyses. Typical values of K and MA/cm2 at 77 K have been measured. Microwave measurements have been performed at f = 87 GHz inserting the film in a copper cavity and at f =1.5 GHz on patterned samples using a microstrip resonator technique. A penetration depth nm is evaluated by fitting the microwave data with phenomenological equations. The minimum value of the surface resistance measured at 4.2 K is 60 and 6 m at 1.5 GHz and 87 GHz respectively. The microwave data are described in the context of a modified two fluid model. An evaluation of the temperature dependence of the scattering rate has been performed through the simultaneous measurement of the surface resistance and the penetration depth.
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