Abstract
In the present work, Zinc Sulphide (ZnS) thin films deposited by resistive heating technique on BK-7 glass substrate. Optical and structural characterizations of ZnS films have been carried out along with the post-deposition annealing at different temperatures. The thickness of the film is monitored by quartz crystal monitor and found to be 500[Formula: see text]nm. Fourier transform infrared (FTIR) spectroscopy provides the qualitative analysis of ZnS film before and after annealing at different temperatures. The optical investigation shows that the as-deposited and annealed ZnS film display the high optical transmittance of (64–68%) in the visible/near infrared region. The optical energy gaps of present as-deposited and annealed ZnS film vary in the range of 3.32–3.18[Formula: see text]eV with the change in annealing temperature.
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