Abstract
In present report on Zn doped (5%) CdO thick film is synthesized on to the glass substrate (pre-cleaned) via sol–gel screen printing process. The synthesized sintered Zn:CdO film are then characterized via XRD, SEM, EDX, UV–vis spectroscopy, PL spectroscopy, and dark conductivity measurement examinations. The XRD examination of sintered film informs the polycrystalline nature and authenticates that Zn:CdO film holds the cubic crystalline structure. SEM examination dispenses the information on morphology of Zn:CdO film. The EDX examination supports the existence of Cd, O, and Zn in the sintered film. The UV–vis spectroscopy via reflectance mode substantiates the direct transition of band gap with a value of 2.60 eV. PL spectra of the sintered film manifest a strong near band edge emission located around 500 nm. The Arrhenius plot (log σDC vs 1000/T) attests the semiconducting nature for the sintered film.
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