Abstract
Highly transparent and adherent ZnS thin films were grown on the glass substrate by spin coating method using an aqueous solution containing zinc sulfate and Polymethylmethacrylate in Tetrahedrafuran as a solvent. The films were characterized by X-ray diffraction, Scanning electron microscopy and UV-Vis spectroscopy techniques. The X-ray diffraction pattern shows the highest reflection peak at d=3.09Å (111). The diffraction angles and plane were (28.77) (111), (33.22) (200), (47.76) (220) and (56.62) (311) respectively. The particle size was found to be at around 35nm. The optical band gap values calculated for the film is 4.12eV. The UV- spectra reveal that films have low absorbance in the visible and near infrared regions. However the absorbance in the ultraviolet region is high. The enhanced absorption is observed in the neighborhood of λ=360nm. The SEM morphologies of the films revealed semispherical structure formed by the smaller particle on the ZnS film surface. Self-assembly of grains are observed in the AFM image of the film.
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