Abstract
The new layered Eu2InTe5 single crystals are grown via the self flux approach. The single‐crystal X‐ray diffraction analysis reveals that this new material has a crystallographic structure in the tetragonal structure with space group I4/mmm (no. 139) and cell parameters a = b = 4.5981(2) Å, c = 24.302(3) Å. The electrical resistivity and Hall effect measurements demonstrate a “bad metal” with a low charge carrier concentration. The thermoelectric analysis gives the values of the thermopower and the figure of merit at room temperature ≈270 μV K−1 and ≈0.1, respectively, making Eu2InTe5 and its derivatives promising for thermoelectric applications.
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