Abstract

Electrospun n-ZnO/n-Bi2O3/epoxy-PVA nanofiber mats with 0 wt% – 20 wt% n-ZnO and 1 wt% n-Bi2O3 fillers were fabricated using electrospinning. An X-ray fluorescence (XRF) unit was used to investigate the X-ray attenuation capability of nanofiber mats at low X-ray energies (16.61–25.2 keV). Scanning electron microscopy (SEM) was used to observe the dispersion of fillers within nanofiber mats. The results revealed that while the nanofibers were produced, their sizes were not smooth and steady, as large beads were found mostly, while only minor bead defects were observed with different n-ZnO loadings. The nanofiber mat with 20 wt% n-ZnO was found to have the highest μm at all tested X-ray energies, indicating that it has the best X-ray attenuation capabilities. In summary, this study sparks the interest in combining n-ZnO and n-Bi2O3 but further investigation is needed in order to achieve nanofiber mats with better characteristics. Improved electrospinning solution preparation could improve the material's prospects of becoming a promising X-ray shielding material.

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