Abstract

Cu 2ZnSnS 4 thin films have been successfully prepared by a novel synthesis process that involves a single step deposition of Cu 2ZnSnS 4 followed by a post-annealing treatment at 550 °C for 60 min in the atmosphere of N 2+H 2S (5%). The microstructure, morphology, composition and optical property of the film have been investigated in detail. It is found that the Na 2S 2O 3 5H 2O concentration in the solution has a significant effect on the Cu 2ZnSnS 4 thin films. X-ray diffraction data indicates that the annealed Cu 2ZnSnS 4 thin films have a kesterite structure with preferred orientation along the (1 1 2) plane. Uniform and compact topographies are observed in some annealed films. From the energy dispersive X-ray spectroscopy analysis, it can be seen that Cu-poor and Zn-rich Cu 2ZnSnS 4 thin films have been obtained. The direct band gap energy of the film is about 1.5 eV.

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