Abstract
Pure ZnO films and ZnO nanoparticle dispersed polyvinylpyrrolidone (PVP) films were prepared on a Pyrex glass substrate by sol–gel dip coating using a zinc acetate precursor. The thin film is extensively characterised for its surface morphology, chemistry, thickness and nanocrystallite size, using various advanced analytical techniques such as SEM, Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy and atomic force microscopy. Under the given processing conditions, ZnO semiconductor thin films with nanocrystallite size 20–30 nm were obtained, and the ZnO nanoparticle size in the PVP matrix increased with increase in ZnO content.
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