Abstract

Total internal reflection microscopy (TIRM) is used to directly, sensitively, and simultaneously measure colloidal interactions, dynamics, and deposition for a broad range of polymer-surfactant compositions. A deposition state diagram containing comprehensive information about particle interactions, trajectories, and deposition behavior is obtained for polymer-surfactant compositions covering four decades in both polymer and surfactant concentrations. Bulk polymer-surfactant phase behavior and surface properties are characterized to provide additional information to interpret mechanisms. Materials investigated include cationic acrylamide-acrylamidopropyltrimonium copolymer (AAC), sodium lauryl ether sulfate (SLES) surfactant, silica colloids, and glass microscope slides. Measured colloid-substrate interaction potentials and deposition behavior show nonmonotonic trends vs polymer-surfactant composition and appear to be synergistic in the sense that they are not easily explained as the superposition of single-component-mediated interactions. Broad findings show that at some compositions polymer-surfactant complexes mediate bridging and depletion attractions that promote colloidal deposition, whereas other compositions produce electrosteric repulsion that deters colloidal deposition. These findings illustrate mechanisms underlying colloid-surface interactions in polymer-surfactant mixtures, which are important to controlling selective colloidal deposition in multicomponent formulation applications.

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