Syndrome-Coupled Rate-Compatible Error-Correcting Codes: Theory and Application

Abstract

Rate-compatible error-correcting codes (ECCs), which consist of a set of extended codes, are of practical interest in both wireless communications and data storage. In this work, we first study the lower bounds for rate-compatible ECCs, thus proving the existence of good rate-compatible codes. Then, we propose a general framework for constructing rate-compatible ECCs based on cosets and syndromes of a set of nested linear codes. We evaluate our construction from two points of view. From a combinatorial perspective, we show that we can construct rate-compatible codes with increasing minimum distances, and we discuss decoding algorithms and correctable patterns of errors and erasures. From a probabilistic point of view, we prove that we are able to construct capacity-achieving rate-compatible codes, generalizing a recent construction of capacity-achieving rate-compatible polar codes. Applications of rate-compatible codes to data storage are considered. We design two-level rate-compatible codes based on Bose-Chaudhuri-Hocquenghem (BCH) and low-density parity-check (LDPC) codes which are two popular codes widely used in the data storage industry, and then we evaluate the performance of these codes in multi-level cell (MLC) flash memories. We also examine code performance on binary and $q$ -ary symmetric channels. Finally, we briefly discuss two variations of our main construction and their relative performance.