Abstract
Synchrotron x-ray fluorescence (SXRF) is valuable for rapid, nondestructive trace element analysis of geologic and biological specimens with minimum detection limits of 10-100 parts per billion weight for 20-..mu..m spots. X-ray diffraction is a significant interference in SXRF analysis of well-ordered specimens. It depends on excitation source (continuum or monochromatic), detection system (energy or wavelength dispersive), and specimen orientation. The most pronounced effects occur for synchrotron continuum and energy-dispersive detectors: thus, the probability of observing diffraction peaks from a randomly oriented quartz crystal is near unity. Diffraction peaks were observed in X-ray fluorescence spectra from silicon, quartz, and deep sea particles at the National Synchrotron Light Source (Brookhaven National Laboratory, Upton NY). Scattering peaks were observed from silica glass. Identification of diffraction effects is best accomplished by changing the specimen orientation since diffraction features are modified while fluorescence lines remain unaltered.
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