Abstract
Structural investigation using X-ray synchrotron radiation has been performed on SrRuO3/SrTiO3/SrRuO3 epitaxial heterostructures, with each constituent layer a few unit cell thick grown on (001) SrTiO3 substrate. Detailed information on the evolution of the in-plane lattice structure has been obtained, in these heterostructures, by grazing incidence diffraction measurements. The samples have been grown by low-pressure pulsed laser deposition. Under our deposition conditions, SrRuO3 layers grow with an elongated cell perpendicular to the substrate surface. The in-plane pseudocubic lattice parameters do not match the in-plane square SrTiO3 structure even in the case of very thin SrRuO3 layers. Such a distortion was found to decrease with increasing the thickness of the SrTiO3 barrier layer.
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