Abstract
ABSTRACTIn this paper we report a synchrotron small angle x-ray scattering (SAXS) study of development of structure in semicrystalline Poly(Ether Ether Ketone), (PEEK) and an 80/20 blend with amorphous Poly(Ether Imide) (PEEK/PEI). Samples were treated to dual stage melt crystallization scheme involving initial isothermal crystallization at T1 followed by a second isothermal period at T2 (T1 < T2). Intensity of small angle scattering was measured in real-time. Structural parameters characterizing the lamellar thickness, 1c, long period, L, and SAXS invariant were deduced from the one-dimensional electron density correlation function assuming an ideal, two-phase structural model.
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