Abstract
Photoluminescence (PL) of a Si-doped polycrystalline diamond film fabricated using the chemical vapor deposition technique was employed to measure the profile of a synchrotron radiation pink x-ray beam emitted from an in-vacuum hybrid undulator at the SPring-8 facility. The spectrum of the section of the diamond film penetrated by the emitted visible red light exhibited a peak at 739nm and a wideband structure extending from 550to700nm. The PL intensity increased with the absorbed dose of the incident beam in the diamond within a dynamic range of 103. A two-dimensional distribution of the PL intensity revealed the undulator beam profile.
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