Abstract
The tunability of synchrotron radiation is exploited to probe the structural properties of SnPc films deposited on a GaAs(0 0 1) surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and that the growth mode is Stranski–Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc molecules in a thick adlayer is close to parallel with the substrate. High photon flux ‘beam damage’ is apparent in an increased binding energy of the Sn4d core level.
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