Abstract
Commercial 15times15times7.5 mm3 coplanar grid CdZnTe detectors were studied on the micron-scale using a collimated high-energy X-ray beam provided by Brookhaven's National Synchrotron Light Source. This powerful tool enables simultaneous studies of detector response uniformity, electronic properties of the material, and effects related to the device's contact pattern and electric field distribution. The availability of a front-end Application Specific Integrated Circuit, developed at Brookhaven's Instrumentation Division, providing low noise amplification of grids and cathode signals, corresponding timing signal and adjustable relative gain, allowed to correlate performance mapping and fluctuations in collected charge. We observed the effect of the strip contacts comprising the coplanar grids on the energy resolution of the coplanar-grid device
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