Synchrotron measurement of the 3D shape of X-ray reflections from the γ/γ′-microstructure of nickel-base superalloys

Abstract

Abstract The 3D shape of X-ray reflections from the γ/γ′-microstructure of a nickel-base superalloy was investigated using synchrotron X-ray radiation and a position sensitive area detector. The measurements were performed on the 4th generation single-crystal nickel-base superalloy TMS138. The results show that X-ray reflections from non-cubic crystallographic planes have a complex 3D shape which changes during rafting. The 3D intensity distributions contain information about the spacing of the planes and their orientation as well. Whereas h00 reflections show the usual splitting into a γ′ and one γ-subreflection, the hh0 and hhh reflections show two and three γ-peaks respectively, resulting from the different types of {100} matrix channels. Therefore, these 3D diffraction measurements supply additional information about the spatial distribution of microstrains.