Abstract

This work demonstrates the utility of synchrotron infrared reflectance microspectroscopy (SIRM), in the far and mid IR, for the determination of the composition of electrogenerated surface films formed during the general and localized corrosion of copper in bicarbonate solution. The back‐reflection geometry was used. The anodic passivation film formed on copper at 0.2 V, in 0.01 M NaHCO3 solution consisted mainly of bicarbonate, copper carbonate dihydroxide or malachite [CuCO3.Cu(OH)2], Cu(OH)2, and possibly some CuO. At higher potentials, the passive film breaks down and localized corrosion occurs leading to the formation of pits. The composition of the surface films inside the pits formed at 0.6 V was found to be essentially the same as that outside but the relative amount of Cu(OH)2 is higher.

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