Abstract

We experimentally demonstrate the synaptic plasticity characteristics in the non-volatile field-effect transistors (NVFET) integrated with amorphous Al 2 O 3 dielectric utilizing voltage-modulated oxygen vacancy and negative charge dipoles. Both short-term plasticity (STP) and long-term potentiation (LTP) behaviors are obtained in a single Al 2 O 3 NVFET. Sub-millisecond LTP speed allows for high-speed processing. Spike-timing-dependent plasticity (STDP) curves with 100 ns spikes are achieved for the amorphous Al 2 O 3 synaptic transistor.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.