Abstract
In this work symbolic methods are used for implementing a procedure for the selection of test frequencies in multifrequency parametric fault diagnosis of analog linear circuits. The proposed approach is based on the evaluation of the condition number and the norm of a sensitivity matrix of the circuit under test. This matrix is determined by exploiting the testability and ambiguity group concepts. A Test Error Index (T.E.I.) is obtained which permits to select the set of frequencies which better leads to locate parametric faults in analog linear circuits. A program implementing the proposed procedure has been realized by using symbolic techniques. Examples of application are also included.
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