Abstract
Traditional methods for statistical analysis of delta-sigma modulators are based on Monte Carlo analysis to iteratively change the design parameters and evaluate the histogram of signal-to-noise ratio (SNR). But Monte Carlo analysis is time-consuming, especially when a number of candidate designs need to be considered. In this brief, a systematic symbolic formulation of statistical SNR variation is made so that variations of capacitors are directly translated to SNR variation. In addition, the symbolic formulation is derived from a generic modulator topology, so that the derived symbolic formulation is applicable to any topology that is covered by the generic topology. Experiments have shown the symbolic formulation can provide fast and reasonably accurate estimation of statistical SNR variation, especially for high-order modulators.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Circuits and Systems II: Express Briefs
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
