Abstract
The nullor–mirror pathological elements have shown advantages in analog behavioral modeling and circuit synthesis. They can be employed to formulate the system of equations for symbolic nodal analysis. This paper presents a systematic analytical technique that performs nodal analysis of nullor–mirror circuits with the consideration of non-ideal active devices. By adding terminal parasitics to the available ideal nullor–mirror equivalents, the non-ideal active device models for the systematic analytical technique can be obtained. The application of the proposed technique to practical circuits is given to demonstrate the feasibility of the proposed method.
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