Abstract
This article proposes the SXC (sum of xs with curtailment) control chart. This chart is nearly as simple as the \(\overline{X}\) chart for the operators to understand and implement. Meanwhile, it is as effective as the CUSUM chart for detecting the process mean shifts. The SXC chart can be applied to random inspection, as well as its special cases, i.e. uniform and 100% inspections. It is found that the SXC chart can reduce the out-of-control average time to signal (ATS) by 74%, on average, over a wide range of mean shifts compared to the Shewhart \(\overline{X}\) chart.
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More From: The International Journal of Advanced Manufacturing Technology
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