Abstract
Room temperature Spin Wave Resonance (SWR) studies of CO1-xZrx thin films were carried out by means of an X-band microwave spectrometer. Co1-xZrx (0 ≤ x ≤ 0.29) thin films were obtained by rf sputtering technique. Saturation magnetization Ms was determined using the SQUID magnetometer. Auger Electron Spectroscopy (AES) was involved to get the concentration depth profiles. It was found that a close-to-surface air contact layer differs from the rest of the film — so the surface mode was observed in SWR experiment. The surface anisotropy energy constant Ks was determined while on the surface the anisotropy energy was assumed to be of the form: Es = - Kscos2θM, where θM is the angle between the magnetization and the normal to the film.
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