Abstract
The process in normal and relaxor ferroelectrics was described as a result of evolution of domain structure. The original mathematical treatment allows to extract the main kinetic parameters from current and elastic light scattering data measured under the action of field pulses. Specific of domain kinetics in ferroelectric thin films and relaxor ceramics was demonstrated. The scenario of evolution of heterophase structure in relaxers during switching and spontaneous backswitching is proposed.
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