SVM and ANN Application to Multivariate Pattern Recognition Using Scatter Data

Abstract

Several methods of Statistical Process Control (SPC) are used to analyze process measurements with the purpose to detect faults that affect the process stability. SPC has a major drawback because it indicates the presence of faults without explaining which ones and where are the faults. In practical applications, SPC just analyses univariate signals limiting the study of multiple measures. Nowadays, novel methods have been developed for fault analysis based on pattern recognition in control charts. However, the majority of these studies follow a univariate approach. This article proposes a multivariate pattern recognition approach using machine learning algorithms in conjunction with a scatter diagram as the proposed method. In particular the aim of this approach is to monitor quality characteristics of a product in a multivariate environment considering states in control and out of control without the constraints of statistical conditions with the possibility of its application in real time. Results using Support Vector Machines (SVM) and the FuzzyARTMAP neural network showed that multivariate patterns can be recognized successfully in 81% of the cases.