Abstract
Abstract The fraction of Frenkel defects that survive in isolated or clustered form during room temperature irradiation of copper has been measured as a function of fluence by a combination of electron microscopy (TEM) and electrical resistivity methods. Both methods indicate that the ratio of surviving to created defects decreased from 12 to 4.7% as the fluence of 14-MeV neutrons increased from 1 × 1020to 2.9 × 1021n/m2.
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