Abstract
Amorphous indium tin oxide (ITO) thin films were deposited on polymethylmethacrylate and polyethyleneterephthalate substrates by radio frequency magnetron sputtering at room temperature. An interesting substrate morphology effect of ITO films on the conductivity, optical transition type and energy band structure was observed. A simplified film system model with a square potential for surface morphology was employed to explain the difference of conductivity. The energy band structures were also calculated based on the theory of amorphous semiconductor. The conclusion demonstrated the width of optical band gap, as well as the relative position of the Fermi level and mobility edge, which can easily be extended to the band structure determination of other transparent conductive films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.