Surface X-Ray Diffraction Studies of Single Crystal Electrochemistry

Abstract

The atomic structure on the metal side of the electrochemical interface depends on the applied electric potential and the nature of the adsorbing species in the electrolyte solution. In this poster we will present some recent results probing surface stress and surface relaxation effects in single crystal metal electrodes that are driven by potential changes. The principal method for probing changes in the atomic structure at the interface is surface x-ray diffraction employing the use of high intensity synchrotron radiation [1]. Measurements on Pt(hkl), Au(hkl) and Ag(hkl) electrodes enable a comprehensive study of the phenomena of surface reconstruction and surface relaxation. The measurements also give insight into the potential-dependent layering in the liquid side of the interface. Both the potential and the structure in the electrolyte layers at the interface alter the metal electronic structure so that the surface in the electrochemical environment is strongly modified from the ultra-high vacuum (UHV) counterpart. A methodology for linking experimental and theoretical approaches for a fundamental understanding of electrochemical reactions will be presented.[1] Y. Gründer and C. A. Lucas, NanoEnergy, 29, 378-393 (2016).