Abstract
The dispersive component of surface free energy,, of amberlite XAD-4 as a function of temperature has been determined using the net retention volumes, V N , of n-alkanes by inverse gas chromatography. The values decrease with increase of temperature. The V N values of acid-base probes have been used to calculate the specific components of free energy of adsorption,, and enthalpy of adsorption. . The Donnet method employing molar deformation polarization of solutes has been used in the evaluation of . The Lewis acid-base parameters are calculated using and are found to be 0.267 and 0.788 respectively, which indicate that the amberlite XAD-4 surface contains mostly basic sites.
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