Abstract

Light-induced charge gratings at the surface of a photorefractive Bi12SiO20 crystal are investigated using electrostatic force detection with an atomic force microscope. The gratings with periods of 2.7 micrometers and 0.22 micrometers are generated by two intersecting Ar+-laser beams at 514 nm. The dark decay times of the stored gratings are determined. Saturation processes are directly observed by a change of the profile of the charge gratings. The polarity of the charge carriers in the material is obtained using a simultaneous measurement of the light-intensity grating.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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