Abstract
Coincidence counting techniques were used to study the plasma desorption of ions from a polycrystalline sample of αZirconium bis(monohydrogen orthophosphate)monohydrate (αZrP). Using coincidence counting in conjunction with time-of-flight (TOF) mass analysis, it was possible to obtain secondary ion spectra with a signal to background ratio a factor of ten better conventional TOF alone. It also was possible to produce a spectrum of SI that were desorbed in coincidence with PO − 3 (characteristic of the αZrP). Cluster ions observed in this spectrum are related to the αZrP crystal structure. This supports a direct emission process for cluster ion production and demonstrates the utility of particle induced desorption in the determination of surface and crystal structure.
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