Abstract
This report summarizes the results accomplished during the funding period of this grant (June 1, 1995 to May 31, 1998). The projects are (1) room-temperature atomic force microscopy (AFM) studies of NbSe{sub 3} doped with various elements and (2) low-temperature scanning tunneling microscopy (STM) studies of NbSe{sub 3}. In addition, AFM was used to study the surface morphology and defects of GaAs films grown on Ge and Ge/Si substracts.
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