Abstract
AbstractUsing the Cr Lα (hν = 572.8 eV) line, which has energy lower than conventional lines, X‐ray photoelectron spectroscopy (XPS) and X‐ray photoelectron diffraction (XPED) can be used to achieve surface‐sensitive and light‐element‐sensitive measurements. We prepared hexagonal boron nitride (h‐BN), which is a light‐element material, grown in a monolayer on a Ni (111) surface, and measured h‐BN/Ni(111) by XPS/XPED excited by the Al Kα (hν = 1486.6 eV) line and the Cr Lα line. Finally, we investigated the excitation‐energy dependence of the XPED method with respect to energy of the photoelectrons and discuss the effectiveness of the XPED method using Cr Lα excitation. Copyright © 2006 John Wiley & Sons, Ltd.
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